X-Ray Facility

The departmental x-ray diffraction facility at CCB is dedicated to the collection and analysis of high-quality x-ray diffraction data of materials of interest to the faculty and their collaborators. The physical forms of these materials include single- or poly- crystalline (powder) solids, liquid crystals, polymers (and bio-polymers), and deposits on substrates, mixtures and composites having good or poor crystallinity.

Analyses include molecular and crystal structure determination (single-crystal or powder),finding lattice parameters, phase identification, percent crystallinity, crystal perfection (rocking curves), residual stress or texture analysis, orientation of crystallite planes and bulk crystal orientation for very large (1 – 30 mm) or very thin (<50 nm) single crystals.

The users of the x-ray facility (including trained students and technicians) are in complete compliance with radiation safety (NJ and Rutgers) and all applicable NJ state laws, and are trained on-site by the lab manager.

Contact:
Thomas J. Emge, Ph.D.
Chief Crystallographic Engineer
Wright-Rieman Laboratories
610 Taylor Road
Piscataway, NJ 08854

Tel: 848-445-2206
Fax: 732-445-5312
emge@rci.rutgers.edu

 

Schedule: SAMPLE SUBMISSION
(accessible from Rutgers only)

 

Fig. 1.

Bruker HiStar system (Figure 1):

  • Sensitive multi-wire area detector
  • High-brilliance rotating Cu anode
  • Parallel mirror optics
  • Evacuated beam path
  • Temperature range of -175 < T < 200 C
  • 3-Circle orientation of large or small samples

 

Fig. 2.

Rigaku GeigerFlex DMAX system (Figure 2):

  • Scintillation detector
  • Sealed-tube Cu anode
  • Focusing mirror optics
  • Transmission mode, i.e., for capillaries
  • Reflection mode, i.e., for bulk or films
  • Open 2-Circles allows for large samples

 

Fig. 3.

Bruker Smart APEX system (Figure 3):

  • CCD area detector
  • Sealed-tube Cu or Mo anode
  • Mono capillary collimation
  • Computerized camera for mounting
  • Temperature range of -175 < T < 200 C
  • 3-Circle orientation of samples 0.01 to 2.0 cm

 

Fig. 4.

Philips XPert system (Figure 4):

  • Mini proportional counter detector
  • Sealed-tube Cu anode
  • Graphite monochromator
  • Programmable receiving slit
  • 15-sample changer; sample spinner
  • Fixed sample; Bragg-Brentano geometry