Eric Garfunkel - Research

Instrumental development for nanoscale materials analysis


XPS ALD MEISRutgers has a strong team involved in instrument development, especially involving ion scattering and microscopy. Medium-energy ion scattering (MEIS) and Rutherford backscattering (RBS) are powerful ion beam based techniques for the determination of compositional and structural properties of surfaces and thin films. Rutgers teams are also developing next generation helium ion microscope (HIM) and scanning probe tools. We collaborate closely with these teams.


Viacheslav Manichev
Group Leader: Viacheslav Manichev


Collaborators: Profs. T. Gustafsson, L. Feldman, P. Batson, E. Andrei, R.A. Bartynski