X-Ray

Our Mission

The departmental x-ray diffraction facility at CCB is dedicated to the collection and analysis of high-quality x-ray diffraction data of materials of interest to the faculty and their collaborators. The physical forms of these materials include single- or poly- crystalline (powder) solids, liquid crystals, polymers (and bio-polymers), and deposits on substrates, mixtures and composites having good or poor crystallinity.

Our Services

Analyses include molecular and crystal structure determination (single-crystal or powder),finding lattice parameters, phase identification, percent crystallinity, crystal perfection (rocking curves), residual stress or texture analysis, orientation of crystallite planes and bulk crystal orientation for very large (1 – 30 mm) or very thin (<50 nm) single crystals.

The users of the x-ray facility (including trained students and technicians) are in complete compliance with radiation safety (NJ and Rutgers) and all applicable NJ state laws, and are trained on-site by the lab manager.

Our Rates

 

X-Ray User Type

Billing Rate*

Department Users Check with the department
External Users Contact the facility for availability and rates

*The billing rates are for the following systems and are subject to change.

 

Our Instruments

Philips XPert SystemPhilips XPERT Powder Diffractometer, room 025
.
 
Mini proportional counter detector
. Sealed-tube Cu anode
. Graphite monochromator
. Programmable receiving slit
. 15-sample changer; sample spinner
. Fixed sample; Bragg-Brentano geometry 

Book Here

 

Rotating Anode Generator (RAG)Rotating Anode Generator (RAG), room 193

Bruker or Photonic Science Data Collection

 

Book Here

 

Bruker HiStar SystemBruker GADDS with Vantec500 Area Detector
. Sensitive CMOS area detector
. High-brilliance rotating Cu anode
. Parallel mirror optics
. He beam path
. Temperature range of -175 < T < 200 C
. 3-Circle orientation of large or small samples

Currently Unavailable

Bruker HiStar SystemBruker Smart APEX Diffractometer
. CCD area detector
. Sealed tube Mo or Cu anode
. Graphite/Monocap optics
. Temperature range of -175 < T < 200 C
. 3-Circle orientation of samples

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Rigaku GeigerFlex DMAX SystemRigaku DMAX Transmission Mode Powder Diffractometer
. Scintillation detector
. Sealed-tube Cu anode
. Focusing mirror optics
. Transmission mode, i.e., for capillaries
. Reflection mode, i.e., for bulk or films
. Open 2-Circles allows for large samples

Currently Unavailable

Philips XPert SystemPhotonic Science Laue Crystal Orienter
.
Allows real-time crystal orientation down to 0.1 degrees accuracy
Delivers an intense X-ray beam with less than 0.3mm on sample
Collects a high resolution X-ray diffraction pattern from the single crystal out of which the right crystallographic plane cut can be selected with excellent accuracy
Python based software allowing remote access control from existing software / system using socket commands

Currently Unavailable

Philips XPert System*COMING SOON* Philips PW2404 Wavelength-Dispersive XRF Spectrometer
. 
Automated magazine of up to seven 12-sample trays
. 
Rh anode with 4 Kw of power, 5 analyzer crystals
. 
Three detectors: xenon sealing, scintillation, and gas flow
. 
Prepared fusions and pressed powder samples
. 
For elements with an atomic mass greater than 5 (boron)
. 
Measures concentrations as low as 1ppm and as high as 100%

Not yet available

Contact

Thomas J. Emge, Ph.D.
Chief Crystallographic Engineer
emge@rci.rutgers.edu
Tel: 848-445-2206
Fax: 732-445-5312

Location

Wright-Rieman Laboratories
610 Taylor Road
Piscataway, NJ 08854-8066