Our Mission
The departmental x-ray diffraction facility at CCB is dedicated to the collection and analysis of high-quality x-ray diffraction data of materials of interest to the faculty and their collaborators. The physical forms of these materials include single- or poly- crystalline (powder) solids, liquid crystals, polymers (and bio-polymers), and deposits on substrates, mixtures and composites having good or poor crystallinity.
Our Services
Analyses include molecular and crystal structure determination (single-crystal or powder),finding lattice parameters, phase identification, percent crystallinity, crystal perfection (rocking curves), residual stress or texture analysis, orientation of crystallite planes and bulk crystal orientation for very large (1 – 30 mm) or very thin (<50 nm) single crystals.
The users of the x-ray facility (including trained students and technicians) are in complete compliance with radiation safety (NJ and Rutgers) and all applicable NJ state laws, and are trained on-site by the lab manager.
Our Rates
X-Ray User Type |
Billing Rate* |
| Department Users | Check with the department |
| External Users | Contact the facility for availability and rates |
*The billing rates are for the following systems and are subject to change: Bruker HiStar, Rigaku GeigerFlex DMAX, Bruker Smart APEX, and Philips XPert
Our Instruments
Bruker HiStar system
. Sensitive multi-wire area detector
. High-brilliance rotating Cu anode
. Parallel mirror optics
. Evacuated beam path
. Temperature range of -175 < T < 200 C
. 3-Circle orientation of large or small samples
Rigaku GeigerFlex DMAX System
. Scintillation detector
. Sealed-tube Cu anode
. Focusing mirror optics
. Transmission mode, i.e., for capillaries
. Reflection mode, i.e., for bulk or films
. Open 2-Circles allows for large samples
Bruker Smart APEX system
. Scintillation detector
. Sealed-tube Cu anode
. Focusing mirror optics
. Transmission mode, i.e., for capillaries
. Reflection mode, i.e., for bulk or films
. Open 2-Circles allows for large samples
Philips XPert system
. Mini proportional counter detector
. Sealed-tube Cu anode
. Graphite monochromator
. Programmable receiving slit
. 15-sample changer; sample spinner
. Fixed sample; Bragg-Brentano geometry
