X-Ray

The departmental x-ray diffraction facility at CCB is dedicated to the collection and analysis of high-quality x-ray diffraction data of materials of interest to the faculty and their collaborators. The physical forms of these materials include single- or poly- crystalline (powder) solids, liquid crystals, polymers (and bio-polymers), and deposits on substrates, mixtures and composites having good or poor crystallinity.

Analyses include molecular and crystal structure determination (single-crystal or powder),finding lattice parameters, phase identification, percent crystallinity, crystal perfection (rocking curves), residual stress or texture analysis, orientation of crystallite planes and bulk crystal orientation for very large (1 – 30 mm) or very thin (<50 nm) single crystals.

The users of the x-ray facility (including trained students and technicians) are in complete compliance with radiation safety (NJ and Rutgers) and all applicable NJ state laws, and are trained on-site by the lab manager.

 CLICK HERE TO SCHEDULE A SAMPLE ANALYSIS  (accessible from Rutgers only)

Bruker HiStar system: Sensitive multi-wire area detector High-brilliance rotating Cu anode Parallel mirror optics Evacuated beam path Temperature range of -175 < T < 200 C 3-Circle orientation of large or small samples
Rigaku GeigerFlex DMAX system: Scintillation detector Sealed-tube Cu anode Focusing mirror optics Transmission mode, i.e., for capillaries Reflection mode, i.e., for bulk or films Open 2-Circles allows for large samples
Bruker Smart APEX system: CCD area detector Sealed-tube Cu or Mo anode Mono capillary collimation Computerized camera for mounting Temperature range of -175 < T < 200 C 3-Circle orientation of samples 0.01 to 2.0 cm
Philips XPert system: Mini proportional counter detector Sealed-tube Cu anode Graphite monochromator Programmable receiving slit 15-sample changer; sample spinner Fixed sample; Bragg-Brentano geometry